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Kobata, Masaaki; Fukuda, Tatsuo; Tanida, Hajime; Kamiya, Junichiro; Morohashi, Yuko; Yamada, Ippei; Abe, Kazuhide
no journal, ,
The mechanism of how the substrate titanium contributes to the advanced getter performance has not been elucidated. In this study, NEG/Ti interface analysis was performed using HAXPES at BL22XU to clarify the effect of Ti substrate on NEG performance.
Fukuda, Tatsuo; Fukada, Yukimasa; Kobata, Masaaki; Yoshii, Kenji; Shobu, Takahisa; Tominaga, Aki; Yamashita, Yoshiyuki*; Tanida, Hajime; Yaita, Tsuyoshi
no journal, ,
no abstracts in English
Tanida, Hajime; Okamoto, Yoshihiro
no journal, ,
For debris samples, in addition to micro-XAFS, we have developed X-ray fluorescence analysis (XRF) and X-ray diffraction (XRD) systems to complement XAFS to provide information on "what elements and in what crystal form are present in the field of view at the micron level" for various materials.